Растровая электронная микроскопия и рентгеновский микроанализ. Том 1 - Гоулдстей Дж.
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289. Wehner G. K-, Anderson G. S. (1970). "The Nature of Physical
Sputtering", in Handbook of Thin Film Technology, eds. L. I. Maissel, R.
Glang, McGraw-Hill, New York.
290. Adachi K-, Hojou K., Katoch М., Kanaya K. (1976). Ultramicroscopy,
2, 17.
291. Hojou K-, Oikawa Т., Kanaya K-, Kimura Т., Adachi K. (1977). Micron,
8,
151.
292. Echlin P. (1975). SEM/1975, IIT Research Institute, Chicago,
Illinois, p. 217.
293. Bratan T. (1978). J. Microsc., 113, 53.
294. Echlin P., Kaye G. (1979). SEM/1979/II, SEM Inc., AMF O'Hare,
Illinois,
p. 21.
295. Echlin P., Pawley J. B" Hayes T. L. (1979). SEM/1979/III, SEM Inc.,
AMF O'Hare, Illinois, p. 69.
296. Franks F. (1980). SEM/1980/II, SEM Inc., AMF O'Hare, Illinois, p.
349.
297. Clay C. S., Peace G. W. (1981). "Ion Beam Sputtering: An Improved
Method of Metal Conting SEM Samples and Shadowing CTEM Samples", J.
Microsc., 122, 281.
298. Peters K. R. (1980). SEM/1980/I, SEM Inc., AMF O'Hare, Illinois, p.
143.
299. Peters K. R. (1979). SEM/1979/II, SEM Inc., AMF O'Hare, Illinois, p.
133.
300. Saubermann A. J., Echlin P. (1975). I. Microsc., 105, 155.
301. Fuchs W., Lindemann B., Brombach J. D., Trosch W. (1978). J.
Microsc., 112, 75.
302. Pawley J. B., Norton J. T. (1978). J. Microsc., 112, 169.
303. Echlin P., Pawley J. B" Hayes T. L. (1979). SEM/1979/III, SEM Inc.,
AMF O'Hare, Illinois, p. 69.
304. Clark J., Echlin P., Moreton R., Saubermann A., Taylor P. (1976).
SEM/ /1976/1, IIT Research Institute, Chicago Illinois, p. 83.
305. Robards A. W., Crosby P. (1979). SEM/1979/II, SEM Inc. AMF O'Hare,
Illinois, p. 325.
306. Flood P. R. (1980). SEM/1980/I, SEM Inc., AMF O'Hare, Illinois, p.
155.
307. Roli J., Flood P. R. (1978). J. Microsc., 112, 359.
308. Sylvester-Bradley P. C. (1969). Micropaleontology, 15, 366.
309. Sela J., Boyde A. (1977). J. Microsc., Ill, 229.
310. Crissman R. S., McCann P. (1979). Micron, 10, 37.
311. Robinson V. N. E. (1978). Scanning, 1, 149.
312. Valdre U. (1979). J. Microsc., 117, 55.
328
Литература
313. Reimer L. (1975). In Physical Aspects of Electron Microscopy and
Micro-beam Analysis, eds. В. M. Siegal, D. R. Beamon, John Wiley, New
York, p. 231.
314. Glaeser R. М., Taylor K- A. (1978). J. Microsc., 112, 127.
315. Glaeser R. M. (1980). In Introduction to Analytical Electron
Microscopy, eds. J. J. Uren, J. I. Goldstein, D. C. Joy, Plenum, New
York, p. 423.
316. Barber T. A. (1976). In Principles and Techniques of SEM: Biological
Applications, Vol. 5, ed. M. A. Hayat, Van Nostrand Reinhold, New York.
317. Barber V. C. (1972). SEM/1972, IIT Research Institute Chicago,
Illinois, p. 321.
318. Wetzel B., Cannon G. B., Alexander E. L" Erickson B. W., Westbrook
E. W. (1974). SEM/I974/I, IIT Research Institute, Chicago, Illinois, p.
581.
319. Lytton D. G., Yuen E., Richard K. A. (1979). J. Microsc., 115, 35.
320. Echlin P., Galle P. (1976). Biological Microanalysis, Pub. Societe
Franqaise de Microscopie Electronique, 24 rue Lhomond 75231 Paris.
321. Albrecht R. М., Wetzel B. (1979). SEM/1979/III, SEM Inc., AMF
O'Hare, Illinois, p. 203.
322. Junger E., Bachmann L. (1980). J. Microsc., 119, 199.
323. Garland C. D., Lee A., Dickson M. R. (1979). J. Microsc., 116, 227.
324. Sanders S., Alexander E., Braylan R. (1975). J. Cell. Biol., 67,
476.
325. Sturgess J. М., Moscarello M. A. (1976). SEM/1976/II, IIT Research
Institute, Chicago, Illinois, p. 145.
326. McKee A E. (1977). SEM/1977/1I, IIT Research Institute, Chicago,
Illinois, p. 239.
327. Drier Т. М., Thurston E. L. (1978). SEM/1978/II, SEM Inc., AMF
O'Hare, Illinois, p. 843.
328. Chatficld E. J" Dillon M. J. (1978). SEM/1978/1, SEM Inc., AMF
O'Hare, Illinois, p. 487.
329. Eisenstadt L. F., Levin B., Golomb H. М., Riddell R. H. (1976).
SEM/1976/ /II, IIT Research Institute, Chicago, Illinois, p. 263.
330. Hayat M. A. (1970). Principles and Techniques of Electron
Microscopy: Biological Applications, Vol. 1, Van Nostrand Reinhold, New
York.
331. Glauert A. M. (ed.) (1974). Practical Methods in Electron
Microscopy, North Holland, Amsterdam.
332. Peters K. R. (1980). J. Microsc., 118, 429.
333. Echlin P., Ralph B., Weibel E. (eds.) (1978). Low Temperature
Biological Microscopy and Microanalysis, Royal Microscopical Society,
Oxford.
334. Steffens W. L. (1978). J. Microsc., 113, 95.
335. Thurley K. W" Mouel W. C. (1974). I. Microsc., 101, 215.
336. Humphreys W. J., Henk W. G. (1979). J. Microsc., 116, 255.
337. Exley R. R., Butterfield B. G., Meylan B. A. (1974). I. Microsc.,
101, 21.
338. Exley R. R., Meylan B. A., Butterfield B. G. (1977). J. Microsc.,
110, 75.
339 Flood P R. (1975). SEM/1975, IIT Research Institute, Chicago,
Illinois,
p. 287.
340. Watson J. H. L., Page R. H., Swedo J. L. (1975). SEM/1975, IIT
Research Institute, Chicago, Illinois, p. 417.
341. Haggis G. H" Bond E. F" Phipps B. (1976). SEM/1976/I, IIT Research
Institute, Chicago, Illinois, p. 281.
342. Humphreys W. J., Spurlock В. O., Johnson J. S. (1977). Principles
