Растровая электронная микроскопия и рентгеновский микроанализ. Том 1 - Гоулдстей Дж.
Скачать (прямая ссылка):
New York, p. 83.
8. a. Broers A. N. (1969). Rev. Sci. Instr * 40, 1040. 6. Broers A. N.
(1969). J. Phys. E, 2, 273.
9. Considine D. M. (1976). Van Nostrand's Scientific Encyclopedia. 5th
ed, Van Nostrand, New York, p. 710.
10. Evans R. D. (1955). The Atomic Nucleus, McGraw-Hill, New York.
11. Kittel C. (1956). Introduction to Solid State Physics, Wiley, New
York. [Имеется перевод: Киттель Ч. Введение в физику твердого тела. - М.:
Физматгиз, 1963.]
12. Shimizu R., Kataoka Y., Ikuta Т., Koshikawa Т., Hashimoto H. (1976).
J. Phys. D., Appl. Phys., 9, 101.
13. Bethe H. A. (1933). In Handbook of Physics, vol. 24, Springer,
Berlin, p. 273.
14. Berger M. J., Setzer S. M. (1964). Nat. Acad. Sci./Nat. Res. Council.
Publ. 1133, Washington, 205.
15. Duncumb P., Reed S. J. B. (1968). In Quantitative Electron Proble
Microanalysis, ed. K. F. J. Heinrich, National Bureau of Standards Spec.
Pub. 298, p. 133.
16. Cosslett V. E., Thomas R. N. (1966). In the Electron Microprobe, eds.
T. D. McKinley, K. F. J. Heinrich, D. B. Wittry, John Wiley, New York, p.
248.
17. Everhart Т. E., Herzog R. F., Chang M. S., De Vore W. J. (1972).
Proc. 6th Intl. Conf. on X-Ray Optics and Microanalysis, eds. G. Shinoda,
K. Kohra, T. Ichinokawa, Univ. of Tokyo, p. 81.
18. Berger M. J. (1963). Methods in Computational Physics, Vol. 1, eds.
B. Adler S. Fernback, M. Rotenberg, Academic, New York.
19. Shimizu R., Murata K. (1971). J. Appl. Phys., 42, 387.
20. Heinrich K. F. J., Newbury D. E., Yakowitz H. (1976). National Bureau
of Standards Spec. Pub. 460, Washington, DC.
21. Shimizu R., Ikuta Т., Everhart Т. E., De Vore W. J. (1975). J. Appl.
Phys., 46, 1581.
22. Henoc, J., Maurice F. (1976). In "Use of Monte Carlo Calculations in
Electron Probe Microanalysis and Scanning Electron Microscopy", eds. K.
F. J. Heinrich, D. E. Newbury, H. Yakowitz, National Bureau of Standards
Spec. Pub. 460, Washington, DC, p. 61.
Литература
Я19
23. Капауа К., Okayama S. (1972). J. Phys. D. Appl. Phys., 5, 43.
24. Cosslett V. E., Thomas R. N. (1964a). Brit. I. Appl.
Phys., 15, 883.
25. Cosslett V. E., Thomas R. N. (1964b). Brit. J. Appl.
Phys., 15, 1283.
26. Cosslett V. E., Thomas R. N. (1965). Brit. J. Appl. Phys.,
16, 779.
27. Cosslett V. E. (1966). X-Ray Optics and Microanalysis, 4th
Intl. Cong, on
X-Ray Optics and Microanalysis, eds. Castaing, P. Deschamps, J.
Philibert, Hermann, Paris, p. 85.
28. Newbury D. E., Yakowitz H. (1976). National Bureau of Standards Spec.
Pub. 460, eds, K. F. J. Heinrich, D. E. Newbury, H. Yakowitz, Washington,
DC, p. 15.
29. Wells О. C. (1977). SEM/1977/I, I IT Research Institute, Chicago,
Illinois, p. 747.
30. Niedrig H. (1978). Scanning, 1, 17.
31. a. Heinrich K. F. J. (1966). X-Ray Optics and Microanalysis 4th Intl.
Cong, on X-Ray Optics and Microanalysis, eds. R. Castaing, P. Deschamps,
J. Philbert, Hermann, Paris, p. 1509. b. Heinrich K. F. J. (1966). The
Elec-
, tron Microprobe, eds. T. D. McKinley, K. F. J. Heinrich, D. B. Wittry,
Wiley, New York, p. 296.
32. Bishop H. (1966). X-Ray Optics and Microanalysis, 4th Intl. Cong, on
X-Ray Optics and Microanalysis, eds. R. Castaing, P. Deschamps, J.
Philibert, Hermann, Paris, p. 153.
33. Heinrich K. F. J. (ed.) (1968). "Quantitative Electron Probe
Microanalysis", National Bureau of Standards Spec. Pub. 298, Washington,
DC, p. 5.
34. Reuter W. (1972). In Proc. 6th Intl. Conf. X-Ray Optics and
Microanalysis, eds. G. Shinoda, K. Kohra, T. Ichinokawa, Univ. Tokyo
Press, Tokyo, p. 121.
35. Newbury D. E., Yakowitz H., Myklebust R. L. (1973). Appl. Phys.
Lett., 23, 488.
36. Arnal F., Verdier P., Vincinsini P. P. (1969). C. R. Acad. Sci.
Paris, 268, 1526.
37. a. Wells О. C. (1974). Scanning Electron Microscopy, McGraw-Hill, New
York. 6. Wells О. C. (1974). SEM/1974, IIT Research Institute, Chicago,
Illinois, p. 1.
38. Murata K. (1973). SEM/1973, IIT Research Institute Chicago, Illinois,
p. 268.
39. Murata K. (1974). J. Appl. Phys., 45, 4110.
40. Seiler H. (1967). Z Angew, Phys., 22, 249.
41. Bruining H. (1954). Physics and Application of Secondary Emission
Process, Pergamon, London. [Имеется перевод: Брюининг Г. Физика и
применение вторичной электронной эмиссии. - М.: Сов. радио, 1958.]
42. Streitwolf Н. W. (1959). Ann. Phys. (Leipzig), 3, 183.
43. Koshikawa Т., Shimizu R. (1974). J. Phys. D.: Appl. Phys., 7, 1303.
44. Everhart Т. E., Wells О. C., Oatley C. W. (1959). J. Electron
Control, 7,.
97.
45. Wittry D. B. (1966). In X-Ray Optics and Microanalysis, 4th.
Intl. Cong,
on X-Ray Optics and Microanalysis, eds. R. Castaing, P. Deschamps,
J.
Philibert, Hermann, Paris, p. 168.
46. Dawson P. H. (1966). J. Appl. Phys., 37, 3644.
47. Reimer L., Tollkamp C. (1980). Scanning, 3, 35.
48. Ranter H. (1961). Phys. Rev., 121, 677.
49. Kramers H. A. (1923). Phil. Mag., 46, 836.
50. Bertin E. P. (1975). Principles and Practice of X-Ray Spectrometric
Analysis, Plenum, New York.