Оптический производстенный контроль - Малакара Д.
Скачать (прямая ссылка):
84. Roycnoudhuri C. Brillouin Spectra of CaF2 Microcrvstals Using a Stable 3-Pass Fabry —Perot Interferometer, Appl. Phys. Lett, 23, 543 (1973a).
85. Roychoudhuri C. Multi-Pass Fabry — Perot interferometer for Brillouin-Scatter Measurements, Ph. D. Thesis, University of Rochester, New York, 1973b; University Microfilms No 74-14413.
86. Roychoudhuri C. Dynamic and Multiplex Holography with Scanning Fabry — Perot Fringes, Opt, Commun., 10, 160 (1974).
87. Roychoudhuri C. Response of Fabrv — Perot Interferometers to Light Pulses or Very Sliort Duration, J. Opt. Soc. Am., 65, 1418 (1975).
88. Saunders J. B. Prccise Topograpliv of Optical Surfaces, J. Res. Nat. Bur. Stand.. 47, І48 (1951).
89. Saunders J. B. In-Line Interferometer, J. Opt, Soc. Am,, 44, 241 (1954).
90. Schulz G. Ein Interiereiizvcrfahren zur absoluten Ebenheitsprufung langs beliebiger Zentralschnitte, Opt. Acta, 14, 375 (1967).
91. Schulz G., Schwider. J. Precise Measurement of Planeness, Appl. Opt,, 6, 1077 (1967).
92. Schulz G. and Schwider J. luten'erometric Testing of Smooth Surfaces. — In: Progress in Optics, Vol. XIII, E. Wolf, Ed,, American Elsevier, New York, 1976.
93 Schulz G., Schwider J., Hiller C., Kicker B. Establisliiiig an Optical Flatness Standart, Appl. Opt, 10, 929 (1971).
94. Schulz L. G. Accurate Thickness Measurements with a Fabry — Perot Interferometer, J. Opt. Soc. Am, 40, 177 (1950a).
95 Schnlz L. G. An Interferomctric Method for Accurate Thickness Measurements of Thin Evaporated Films, J. Opt. Soc. Am, 40, 690 (1950b).
96 Schulz L. G. The effect of Phase Clianges in While Light Interferometry, J. Opt. Soc. Am, 41, 261 (1951a).
167 97. Schulz L. G. An Snicrfcromclric Meihod for the Determination of Uie Absorbfion Coefficients of Metals, with Results for Silver and Aluminium, J. Opt. Soc. Am, 41, 1047 (1951b).
98. Schulz L. G., Scheibner E. J. An Experimental Study of the Change in Piiase Accompanying Refleeiion of Light from Thin Evaporaled Films, J. Opt. Soc. Am., 40, 761 (1950).
99. Schwider J. Informalionssieigenuig in der Yieistraiiliiiicrfeiomeirie, Opt. Acl a, 15, 351 (1968).
100. Shaaian M. S., Little V. I. Tiie Application of Multiple-Beam While-Light Fringes to the Study of Surfaces, J. Phys., D8, 1003 (1975).
101. SIRA New Aid for the Optical Industry: an Interferometer for Testing Deep!} Curved Lens Surfaces, SlRA News-Shecd (Impact), No. 5, 1967.
102. Thornton B. S. An Unccrtaintv Relation in Inierferometrv, Opt. Acta, 4, 41 (1957).
103. Tolansky S. New Non-localized Interference Fringes, Philos. Mag., 34, 555 (1943).
104. Toiansky S. New Contributions to lnterferometry. II: New Phenomena with Newton's Rings; III: The Differential Polarization Phase Change on Reflection at a Thin Silver Film, Philos. Mag, Ser. 7, 35, 120, 179 (1944).
105. Tolansky S. New Contributions to Intcricrcimetry. V: New Multiple-Beam Wliite Light Interference Fringes and Their Applications Philos. Mag., Ser. 7, 36, 225 (1945a).
106. Tolansky S. Topography of Crystal Faces. 1: The Topography of a (IOO) Faces of a Left-Handed Quartz Crystal Faces.— In 1: The Topographv oi Cleavage Faces of Mica and Selenite, Proc. Roy. Soc., Al84, 41, 51 (1945b).
107. Tolansky S. Further lnterferomctric Studies with Mica; New Multiple-Beam Fringes and Their Application, Proc. Roy. Soc., A186, 261 (1946).
108. Tolansky S. Multiple-Beam lnterferometry oi Surfaces and Films, Oxford University Press, Oxford, 1948a, Dover, New York,'1970.
109. Tolansky S. Multiple-Beam lnterferometry, Oxford University 'Press, Oxford, 1948b.
110. Tolansky S. Multipie-Beam Fringes, Clarendon Press, Oxford, 1948c.
111. Tolansky S. Surface Microtopography, lnterscicnce, New York, 1960.
112. Tolansky S. Introduction Io lnterferometry, Longmans, London, 1966.
113. Toiansky S. Microstructure of Suriaees Using lnterferometry, Edward Arnold, London. 1968.
114. Tolansky S., Emara S. H. Precision Multiple-Beam Inlerfercnce Fringes with Higli Lateral Microscopic Resolution. J. Opt. Soc. Am., 45, 792 (1955).
115. Vinokurov V. M., Ardamatski A. L., Popov L. V. The Structure of the Disrupted Layer.— In: Generation of Surfaces, K. G. Kumanin, Fd., Focal Library London, 1962, Chap. I (оригинал на русском языке: — В кн.: Формообразование оптических поверхностей, Оборонгиз, 1962, с. 7—57).
116. Vrabel J., Brown Е. В. The Practice of Interferometrv, Opt. Eng., 14, 124 (1975).
117. Williams W. E. Applications of lnterferometry, Methucn, London, 1950. ГЛАВА 7 Интерферометры с многократным прохождением лучей
П. Харихаран
В этой главе рассмотрены разновидности традиционных интерферометров для оптического контроля, в которых один пли несколько волновых фронтов возвращаются обратно, а также эффекты, связанные с их двумя и более проходами через всю систему либо часть се. Такие интерферометры часто имеют явные преимущества перед обычными приборами.
7.1. ИНТЕРФЕРОМЕТРЫ С ДВОЙНЫМ ПРОХОЖДЕНИЕМ ЛУЧЕЙ
